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RISIS Online Training on Thematic and spatial analysis of technologies using Cortext and RISIS patent database
Nov 8, 2021 @ 2:00 pm - Nov 10, 2021 @ 1:00 pm
The Online Methodological course on Thematic and spatial analysis of technologies using Cortext and RISIS patent database is organized by Université Gustave Eiffel and will take place on online platform on 8-10 November 2021.
Deadline for request of participation:
31st of October 2021.
Course main objectives:
This workshop aims at providing methodological and practical skills to analyse patent documents. It relies on the facilities available at UGE in Paris, the RISIS Patent Database and the Cortext tool. The workshop will be centred on two dimensions of the technology analyses using patents: network analysis and geography.
Participants will first investigate technology dynamics through network analysis of cooccurrences of patent classes (co-classification) and cooccurrences of terms (resulting from automatic lexical treatment) appearing in patent titles and abstracts. Second, participants will explore the spatial dimension of technology development analysing inventor locations as they appear in patent documents. Addresses will be geo-coded and allocated to different geographical units: country, regions and metropolitan areas.
Details on the course programme are presented in the call for participation and in the leaflet of the course (see the links below).
-Senior scientists, early career researchers and PhD students
-Policy makers at the local, regional, national and international level (e.g., European Commission)
Priority will be given to early career researchers and PhD students aiming to master tools and methodologies to dig into patent information.
Participants should have some basic notions about patents, IP and STI analysis.
It is not necessary for participants to have already used Cortext facilities.